The subject of my activities may be divided in two categories:
In the field of IBA methodology:
- measuring missing non-Rutherford cross sections for ERDA using 4He beam;
- predicting the energy and depth resolution of the various IBA methods with reasonable precision;
- treating the case of overlapping peaks that arise from particles of different type in complex NRA energy spectra;
- widening the range of present computer programs used in data reduction, especially by taking into account the effects of angular multiple scattering of the probing beam particles;
- including energy spread effects in spectrum simulation.
In the field of solid state physics and material science:
- studying heterogeneous materials, e.g., porous silicon, multilayers, etc.
- Applying IBA to these problems taking into account the special effects showing up in porous media.
- Studying the effects of ion implantation in porous silicon: structural changes and physical properties.
- Modification of the properties of the surface by ion implantation, fundamental processes of ion implantation.
- Magnetic structure and phase analysis in thin films by Synchrotron Mössbauer Reflectometry (SMR).
- Oxidation mechanism and kinetics of SiC.